Hello community,
I have a problem with a WDC WD40EFRX.
I bought the HDD used. Unfortunately you cannot read SMART values. No attributes available. Is it possible to restore these?
Thanks
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.1.74-Unraid] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD40EFRX-68N32N0
Serial Number: WD-WCC7K2TLKS18
LU WWN Device Id: 5 0014ee 2113d6bd2
Firmware Version: 82.00A82
User Capacity: 4,000,787,030,016 bytes [4.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 3.5 inches
Device is: In smartctl database 7.3/5577
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Mar 4 09:22:33 2024 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
No failed Attributes found.
General SMART Values:
Offline data collection status: (0xff) Offline data collection activity
is in a Vendor Specific state.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 255) Self-test routine in progress…
150% of test remaining.
Total time to complete Offline
data collection: (65535) seconds.
Offline data collection
capabilities: (0xff) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Abort Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0xffff) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0xff) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 255) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 255) minutes.
SCT capabilities: (0x303d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 5 Comprehensive SMART error log
0x03 GPL R/O 6 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0-0xa7 GPL,SL VS 16 Device vendor specific log
0xa8-0xb6 GPL,SL VS 1 Device vendor specific log
0xb7 GPL,SL VS 56 Device vendor specific log
0xbd GPL,SL VS 1 Device vendor specific log
0xc0 GPL,SL VS 1 Device vendor specific log
0xc1 GPL VS 93 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
ATA_READ_LOG_EXT (addr=0x03:0x00, page=0, n=1) failed: scsi error badly formed scsi parameters
Read SMART Extended Comprehensive Error Log failed
Read SMART Error Log failed: scsi error badly formed scsi parameters
ATA_READ_LOG_EXT (addr=0x07:0x00, page=0, n=1) failed: scsi error badly formed scsi parameters
Read SMART Extended Self-test Log failed
Read SMART Self-test Log failed: scsi error badly formed scsi parameters
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 258 (0x0102)
Device State: Active (0)
Current Temperature: 1 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/0
Vendor specific:
01 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
SCT Temperature History Version: 2
Temperature Sampling Period: 65535 minutes
Temperature Logging Interval: 0 minutes
Min/Max recommended Temperature: 0/65 Celsius
Min/Max Temperature Limit: -41/85 Celsius
Temperature History Size (Index): 65535 (65534)
Invalid Temperature History Size or Index
SCT Error Recovery Control:
Read: 70 (7.0 seconds)
Write: 70 (7.0 seconds)
ATA_READ_LOG_EXT (addr=0x04:0x00, page=0, n=1) failed: scsi error badly formed scsi parameters
Read Device Statistics page 0x00 failed
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x8000 4 77 Vendor specific
