here is my SMART log.
my hdd was ok for 1557 days + 8 hours. and that probably the issue.
SMART running tests, which block the normal IO operations. that why hdd slows down. it is a firmware issue.
root@mini:/home/axet# smartctl --all /dev/sde
smartctl 5.41 2011-06-09 r3365 [ppc-linux-3.7-trunk-powerpc] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Green
Device Model: WDC WD7500AACS-00ZJB0
Serial Number: WD-WCASN0041073
LU WWN Device Id: 5 0014ee 20113f7b2
Firmware Version: 01.01B01
User Capacity: 750,156,374,016 bytes [750 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Feb 17 00:02:20 2013 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (19800) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 228) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 150 022 021 Pre-fail Always - 7475
4 Start_Stop_Count 0x0032 096 096 000 Old_age Always - 4724
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 200 200 051 Old_age Always - 0
9 Power_On_Hours 0x0032 049 049 000 Old_age Always - 37384
10 Spin_Retry_Count 0x0012 100 100 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 80
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 50
193 Load_Cycle_Count 0x0032 151 151 000 Old_age Always - 149921
194 Temperature_Celsius 0x0022 110 091 000 Old_age Always - 40
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 051 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 54 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 54 occurred at disk power-on lifetime: 37376 hours (1557 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
– – – – – – –
40 51 40 c0 e4 b5 40 Error: UNC 64 sectors at LBA = 0x00b5e4c0 = 11920576
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
– – – – – – – – ---------------- --------------------
25 d0 40 c0 e4 b5 54 00 00:37:33.198 READ DMA EXT
b0 d0 00 ff 4f c2 00 00 00:37:33.191 SMART READ DATA
25 d0 40 c0 e4 b5 54 00 00:37:26.930 READ DMA EXT
25 d0 40 c0 e4 b5 54 00 00:37:20.668 READ DMA EXT
25 d0 40 c0 e4 b5 54 00 00:37:14.406 READ DMA EXT
Error 53 occurred at disk power-on lifetime: 37376 hours (1557 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
– – – – – – –
40 51 40 c0 e4 b5 40 Error: UNC 64 sectors at LBA = 0x00b5e4c0 = 11920576
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
– – – – – – – – ---------------- --------------------
25 d0 40 c0 e4 b5 54 00 00:37:26.930 READ DMA EXT
25 d0 40 c0 e4 b5 54 00 00:37:20.668 READ DMA EXT
25 d0 40 c0 e4 b5 54 00 00:37:14.406 READ DMA EXT
25 d0 40 c0 e4 b5 54 00 00:37:10.571 READ DMA EXT
25 d0 40 80 e4 b5 54 00 00:37:10.570 READ DMA EXT
Error 52 occurred at disk power-on lifetime: 37376 hours (1557 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
– – – – – – –
40 51 40 c0 e4 b5 40 Error: UNC 64 sectors at LBA = 0x00b5e4c0 = 11920576
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
– – – – – – – – ---------------- --------------------
25 d0 40 c0 e4 b5 54 00 00:37:20.668 READ DMA EXT
25 d0 40 c0 e4 b5 54 00 00:37:14.406 READ DMA EXT
25 d0 40 c0 e4 b5 54 00 00:37:10.571 READ DMA EXT
25 d0 40 80 e4 b5 54 00 00:37:10.570 READ DMA EXT
25 d0 40 40 e4 b5 54 00 00:37:10.569 READ DMA EXT
Error 51 occurred at disk power-on lifetime: 37376 hours (1557 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
– – – – – – –
40 51 40 c0 e4 b5 40 Error: UNC 64 sectors at LBA = 0x00b5e4c0 = 11920576
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
– – – – – – – – ---------------- --------------------
25 d0 40 c0 e4 b5 54 00 00:37:14.406 READ DMA EXT
25 d0 40 c0 e4 b5 54 00 00:37:10.571 READ DMA EXT
25 d0 40 80 e4 b5 54 00 00:37:10.570 READ DMA EXT
25 d0 40 40 e4 b5 54 00 00:37:10.569 READ DMA EXT
25 d0 40 00 e4 b5 54 00 00:37:10.567 READ DMA EXT
Error 50 occurred at disk power-on lifetime: 37376 hours (1557 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
– – – – – – –
40 51 40 c0 e4 b5 40 Error: UNC 64 sectors at LBA = 0x00b5e4c0 = 11920576
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
– – – – – – – – ---------------- --------------------
25 d0 40 c0 e4 b5 54 00 00:37:10.571 READ DMA EXT
25 d0 40 80 e4 b5 54 00 00:37:10.570 READ DMA EXT
25 d0 40 40 e4 b5 54 00 00:37:10.569 READ DMA EXT
25 d0 40 00 e4 b5 54 00 00:37:10.567 READ DMA EXT
25 d0 40 c0 e3 b5 54 00 00:37:10.566 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
root@mini:/home/axet#