I’m using SiliconDrive USB CF card, the card is failed when reading certain sectors of the card. The symtoms is that some of the sectors are unreadable.
We test the card with WD diagnostics.
The quick test failed, the test code is “08-Too many bad sectors detected”. The SMART Status is not available. But the extended passes test. The SMART Status is not available either for extended test.
I’m wondering why extended test past, in principle, it should also report bad sectors, right?
Could anybody explain this to me? I appricate any reply here.
Thanks for your time.