Ho comprato presso un vostro rifornitore 6 wd red 3tb, al fine di creare per dei clienti due nas con due rispettivi raid5 software.
Con i primi 3 hdd non ho avuto nessun tipo problema, il mio cliente lo usa quotidianamente ed è rimasto molto soddisfatto. Con gli ultimi 3 non posso dire la stessa cosa.
La prima volta non sono nemmeno riuscito a creare il raid5 software. Ho eseguito ogni smart test possibile, incluso quello della wd ovviamente, e non c’era niente da fare per un hdd: troppi settori danneggiati.
Mi sono informato alla perfezione, visto che era la prima volta che mi capitava una cosa simile, ho letto tutte le vostre guide per poter farvi avere il pacco più sicuro possibile e ve l’ho mandato indietro in garanzia tramite RMA.
Dopo tre settimane mi ritorna l’hdd e noto subito che non me ne avete mandato indietro uno nuovo, ma probabilmente qualcosa che, apparentemente, eravate riusciti ad aggiustare. L’etichetta infatti era diversa, ma ero risucito ad accertarmi che fosse un wd 3tb red simile a quelli che avevo comprato in precedenza. Oltretutto erano presenti delle righe, o forse sarebbe meglio chiamarli solchi, abbastanza profondi sui lati. E pensare che io mi ero fatto dei problemi sulle condizioni di quello che ho vi ho mandato indietro! ma questo è il meno…
Provo a creare il raid5 software, la cosa va a buon fine. Lo provo per un paio di giorni e il vostro “nuovo” hdd viene smontato dal raid perchè è fallito. Tramite il vostro Tool della WD con un long test riesco a riparare 8 settori danneggiati.
Ritento nell’impresa di ricostruire il raid5 e ci riesco.
Ora, dopo una settimana di prova la situazione è questa:
-Raid5 active and clean.
-Tutti gli hard disk sono sani e hanno passato lo smart test.
-Ho provato ad eseguire manualmente uno smart test su ognuno di essi ed è stato completato senza problemi.
-I’ error log del vostro “nuovo” hard disk presenta solamente ATA ERROR COUNT: 3152.
Sono abbastanza preoccupato visto che il mio cliente avrebbo voluto utilizzare i vostri prodotti per poter mettere al sicuro tutti i suoi dati e i suoi file. Allo stesso tempo sono decisamente deluso. Ok, posso capire che, nonostante sia molto raro, un hard disk nuovissimo sia danneggiato, ma non che l’hard disk che mi mandate indietro dal RMA dia tutti questi problemi.
Oltre a perdere personalmente tempo con tutti questi controlli, sto anche perdendo la fiducia che un cliente aveva nei miei confronti. Il quale dovrà pagare una parte del mio lavoro e molto probabilmente anche una seconda restituizione del prodotto in garanzia.
Al momento sto eseguendo un long smart test con smartctl su linux e quando avrà finito lo rieseguirò col vostro tool della WD su windows.
Di seguito vi posto il log di smartctl tool relativo al vostro “nuovo” hdd:
Cosa dovrei fare a questo punto? Spero che possiate aiutarmi.
Attendo una vostra risposta.
Grazie.
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smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: WDC WD30EFRX-68EUZN0
Serial Number:
LU WWN Device Id: 5 0014ee 2b3fbacb6
Firmware Version: 80.00A80
User Capacity: 3,000,592,982,016 bytes [3.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 9
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sat May 17 12:03:18 2014 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (42960) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x703d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 199 197 051 Pre-fail Always - 3167
3 Spin_Up_Time 0x0027 177 177 021 Pre-fail Always - 6141
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 51
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 221
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 51
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 31
193 Load_Cycle_Count 0x0032 199 199 000 Old_age Always - 3435
194 Temperature_Celsius 0x0022 123 108 000 Old_age Always - 27
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 3152 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 3152 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
40 51 08 0a 00 00 e0 Error: UNC 8 sectors at LBA = 0x0000000a = 10
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 08 00 00 e0 08 21:19:41.619 READ DMA
ec 00 00 00 00 00 a0 08 21:19:41.611 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 21:19:41.611 SET FEATURES [Set transfer mode]
Error 3151 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
40 51 08 0a 00 00 e0 Error: UNC 8 sectors at LBA = 0x0000000a = 10
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 08 00 00 e0 08 21:19:41.575 READ DMA
ec 00 00 00 00 00 a0 08 21:19:41.567 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 21:19:41.567 SET FEATURES [Set transfer mode]
Error 3150 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
40 51 08 0a 00 00 e0 Error: UNC 8 sectors at LBA = 0x0000000a = 10
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 08 00 00 e0 08 21:19:41.539 READ DMA
ec 00 00 00 00 00 a0 08 21:19:41.531 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 21:19:41.531 SET FEATURES [Set transfer mode]
Error 3149 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
40 51 08 0a 00 00 e0 Error: UNC 8 sectors at LBA = 0x0000000a = 10
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 08 00 00 e0 08 21:19:41.495 READ DMA
ec 00 00 00 00 00 a0 08 21:19:41.487 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 21:19:41.487 SET FEATURES [Set transfer mode]
Error 3148 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
40 51 08 0a 00 00 e0 Error: UNC 8 sectors at LBA = 0x0000000a = 10
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 08 00 00 e0 08 21:19:41.451 READ DMA
ec 00 00 00 00 00 a0 08 21:19:41.443 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 21:19:41.443 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
1 Conveyance offline Completed without error 00% 221 -
2 Short offline Completed without error 00% 204 -
3 Short offline Completed without error 00% 203 -
4 Short offline Completed without error 00% 129 -
5 Short offline Completed without error 00% 114 -
6 Short offline Completed without error 00% 114 -
7 Short offline Completed: read failure 70% 106 10
8 Short offline Completed: read failure 70% 106 10
9 Short offline Completed: read failure 70% 99 10
#10 Short offline Completed: read failure 70% 99 10
#11 Short offline Completed without error 00% 24 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
__________
