6 of 6 drives faulty? (SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed...)

I’m building up RAID6 on Openmediavault right now. During the resync process there where similar S.M.A.R.T. error messages:

After the resync i checked all my drives and here is one drive as an example:

=== START OF INFORMATION SECTION ===
Device Model: WDC WD40EFRX-68WT0N0
Serial Number: WD-WCCXXXXXX
LU WWN Device Id: 5 0014ee 2b4dab5a0
Firmware Version: 80.00A80
User Capacity: 4.000.787.030.016 bytes [4,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 9
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Wed Jul 30 16:43:41 2014 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection: (52380) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x703d) SCT Status supported.
                                        SCT Error Recovery Control supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
  3 Spin_Up_Time 0x0027 186 186 021 Pre-fail Always - 7683
  4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 9
  5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
  7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
  9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 117
 10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
 11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 9
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 8
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 23
194 Temperature_Celsius 0x0022 118 109 000 Old_age Always - 34
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0

SMART Error Log Version: 1
ATA Error Count: 4
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 4 occurred at disk power-on lifetime: 96 hours (4 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00 Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  -- -- -- -- -- -- -- -- ---------------- --------------------
  b0 d5 01 e1 4f c2 00 00 02:22:10.072 SMART READ LOG
  b0 d5 01 e1 4f c2 00 00 02:22:10.072 SMART READ LOG
  b0 d5 01 e1 4f c2 00 00 02:22:10.072 SMART READ LOG
  b0 d6 01 e0 4f c2 00 00 02:22:10.071 SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 00 02:22:10.070 SMART WRITE LOG

Error 3 occurred at disk power-on lifetime: 96 hours (4 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00 Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  -- -- -- -- -- -- -- -- ---------------- --------------------
  b0 d5 01 e1 4f c2 00 00 02:22:10.072 SMART READ LOG
  b0 d5 01 e1 4f c2 00 00 02:22:10.072 SMART READ LOG
  b0 d6 01 e0 4f c2 00 00 02:22:10.071 SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 00 02:22:10.070 SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 00 02:22:10.069 SMART WRITE LOG

Error 2 occurred at disk power-on lifetime: 44 hours (1 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00 Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  -- -- -- -- -- -- -- -- ---------------- --------------------
  b0 d5 01 e1 4f c2 00 00 01:02:08.970 SMART READ LOG
  b0 d5 01 e1 4f c2 00 00 01:02:08.969 SMART READ LOG
  b0 d5 01 e1 4f c2 00 00 01:02:08.969 SMART READ LOG
  b0 d6 01 e0 4f c2 00 00 01:02:08.968 SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 00 01:02:08.968 SMART WRITE LOG

Error 1 occurred at disk power-on lifetime: 44 hours (1 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 00 00 00 00 Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  -- -- -- -- -- -- -- -- ---------------- --------------------
  b0 d5 01 e1 4f c2 00 00 01:02:08.969 SMART READ LOG
  b0 d5 01 e1 4f c2 00 00 01:02:08.969 SMART READ LOG
  b0 d6 01 e0 4f c2 00 00 01:02:08.968 SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 00 01:02:08.968 SMART WRITE LOG
  b0 d6 01 e0 4f c2 00 00 01:02:08.967 SMART WRITE LOG

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 117 -

SMART Selective self-test log data structure revision number 1
 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
    1 0 0 Not_testing
    2 0 0 Not_testing
    3 0 0 Not_testing
    4 0 0 Not_testing
    5 0 0 Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Are these errors “real” errors and the drive dies? I can’t believe that all of my drives are sh**?! On the other hand fhe S.M.A.R.T. values are looking good so far…

And all drives are not older than 6 months!

What’s wrong here?

And what is the Airflow_temperature_cel ? The temperature of my drive is under 45 °C but it’s posting such messages the whole time (look at the first pic)

Thanks

greets

I would suggest checking the drives individually to see if the SMART Read Error Rate is non-zero. I don’t know how reliable are the Openmediavault logs, especially when the Raw Read Error rate increases on one and decreases on the other.

Hi,

thanks for your reply!

I checked all my drives and every drive and there are no errors (non-zero values at RAW_VALUE) on every drive!

The airflow temperature value is maybe wrong, too? I hope this is a bug in omv.

greets

@mcflym, relax, nothing appears to be wrong. :slight_smile:

The reason that the log is recording all those warnings (aka “advisories”) is that the SMART values are changing. That’s not unusual, and in most cases it is to be expected and is perfectly normal.

For example, as the drive warms up from ambient temperature to normal operating temperature, one would expect to receive an advisory message to that effect. The “Airflow_Temperature_Cel” message in your screenshot is telling us that the internal temperature of your Seagate HDD (WWN = 0x5000C50…) has increased from 28C (= 100 - 72) to 34C (= 100 - 66).

The message, “Seek Error Rate changed from 100 to 200”, is reported by each of your WD HDDs (WWN = 50014ee…). Once again this appears to be normal. A new drive may have initial SMART values which do not resemble those of a drive that has “bedded in”. It may be that the drive needs to accumulate a minimum number of seeks before its seek error rate can be considered to be statistically significant. Until this time the normalised value of the SER might remain at 100, even if the error rate is high. In fact Seagate’s drives operate in exactly this way. Be prepared for a surprise after your Seagates have recorded 1 million seeks. The SER value will drop from 100 to 60. Once again, this is normal and indicates a zero error rate.

I have attempted to understand Seagate’s counterintuitive SMART attributes in the following article:

http://www.users.on.net/~fzabkar/HDD/Seagate_SER_RRER_HEC.html

I suspect that the ATA Error Counts are related to the SMART READ LOG entries in the drives’ SMART Error Logs. It would seem that the following sequence of ATA commands executes without error:

SMART WRITE LOG
SMART WRITE LOG
SMART WRITE LOG
SMART READ LOG

However, if the above commands are immediately followed by a second SMART READ LOG command, the command produces an Abort error. A third SMART READ LOG command produces an additional Abort error. This would suggest that the commands are being executed out-of-order, perhaps due to an NCQ bug (???).

I could be wrong, but I suspect that each SMART READ LOG expects to preceded by an appropriate SMART WRITE LOG, ie …

SMART WRITE LOG E0h
SMART READ LOG E1h
SMART WRITE LOG E0h
SMART READ LOG E1h
SMART WRITE LOG E0h
SMART READ LOG E1h

If the Seagate drives do not produce the same errors, then this would suggest that the WD drives may be affected by a benign firmware bug, or that there may be a problem in smartmontools (smartctl).

BTW, the ATA standard enables certain SCT commands to be sent to the drive encapsulated as data via the SMART WRITE/READ LOG commands.

These commands are listed in the smartctl report:

SCT Status supported
SCT Error Recovery Control supported
SCT Feature Control supported
SCT Data Table supported

AIUI, the way it works is that the host places the “SCT Error Recovery Control” command, say, in SMART log E0h and then sends it to the drive via the SMART WRITE LOG (E0h) command. The drive processes the request and places the results in log E1h. The host then retrieves these results via a SMART READ LOG (E1h) command.

You can see these log numbers in the Sector Number Register (SN) in smartctl’s error dump.

BTW, WD’s drives sometimes record additional SMART attributes which are hidden from the user.

Extracting SMART data from WD MODs 20 - 26:
http://malthus.zapto.org/viewtopic.php?t=968&p=4241

WOW

Thank you for your detailed answer!